Application Note Overview

For measurements of non-connectorized devices, test fixtures, probes or other structures are used to adapt from the coaxial interface of the test setup to the device under test (DUT). To ensure accurate measurements, it is essential to characterize the lead-ins and lead-outs, allowing their effects to be mathematically removed or de-embedded from results. The note offers practical guidance for characterizing and de-embedding these structures using R&S Vector Network Analyzers. Additionally, it explains how to export the characterized data as an S-Parameter file for use with other test equipment, such as oscilloscopes.