Signal Integrity Analysis for High Speed Datacom Interfaces

Topics Covered

R&S®RTP and R&S®RTO Oscilloscopes
R&S®RTx-K133 Advanced Jitter Option
Measuring the Transfer Function

Application Note Overview

Analyzing high speed datacom interfaces is an important task and ensures signal integrity. One major challenge of this analysis is the connection between the physical interface and the oscilloscope, as most of the datacom interfaces do not provide test connections suitable for RF. A test fixture is required as a bridge between the high speed datacom IF and the RF connector of the oscilloscope, but this will affect the signal integrity measurement. This application card demonstrates how oscilloscopes with advanced jitter option can analyze and separate jitter contributions. Additionally, the option can evaluate the impact of test fixtures and traces inherently, providing user a good understanding of the impact of their test setup.

Thank You For Your Interest

First Name *

Last Name *

Company Name *

Job Title *

Business Email *

Zip Code *

Country *

By downloading an application note, your contact information will be shared with the sponsoring company, Rohde & Schwarz GmbH & Co.KG and the Rohde & Schwarz entity or subsidiary company mentioned in the imprint of www.rohde-schwarz.com, and you may be contacted by them directly via email or phone for marketing or advertising purposes subject to their statement of privacy.

By clicking ‘Submit’ you agree to our Terms of Use. We take your privacy seriously. For more information please read our Privacy Policy. By registering with All About Circuits you will automatically receive our weekly Product Update and Technology Insider eNewsletters.